Effects of Detector Black Level in ADF-STEM Imaging
نویسندگان
چکیده
منابع مشابه
Effects of tilt on high-resolution ADF-STEM imaging.
A study of the effects of small-angle specimen tilt on high-resolution annular dark field images was carried out for scanning transmission electron microscopes with uncorrected and aberration-corrected probes using multislice simulations. The results indicate that even in the cases of specimen tilts of the order of 1 degree a factor of 2 reduction in the contrast of the high-resolution image sh...
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A study of high-resolution ADF imaging in uncorrected and aberration-corrected STEMs was carried out by multislice simulation. The presence of amorphous layers at the surface of a crystalline specimen is shown to significantly alter the visibility of the atomic columns. After propagating through an amorphous layer a portion of the beam passes without any alteration while scattered electrons int...
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Quantitative ADF-STEM imaging paired with image simulations has proven to be a powerful technique for determining the three dimensional location of substitutionally doped atoms in thin films. Expansion of this technique to lightly-doped nanocrystals requires an understanding of the influence of specimen mistilt on dopant visibility due to the difficulty of accurate orientation determination in ...
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Monte Carlo Method is used to simulate a double layer gadolinium-amorphous silicon thermal neutron detector. The detector fabricated in pixel array configuration has various applications including neutron imaging. According to the simulation results, a detector consisting of a gadolinium (Gd) film with thickness of 2-4 ~m, sandwiched properly with two layers of sufficiently thick (-30 ?µm) hydr...
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Bilayer graphene possesses two degenerate lowest energy configurations which are geometrically mirrored—AB and BA stacking[1]. Both stacking geometries have been observed as domains in bilayer systems grown by chemical vapor deposition[2]. Here we examine the structure at the interfaces of stacking domains using atomic-resolution scanning transmission electron microscopy (STEM) and standard dar...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2002
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927602105307